QUARZ: Test and Qualification Center for Concentrating Solar Power Technologies
Mirrors and Collector Shape Qualification
Deflectometry Measurement System for analysis of reflector surface slope error.
This non-contact method allows for accurate and quick measurements of mirror shape accuracy and therefore the assessment of concentration quality Mirror panel Deflectometry:
Projection of a known stripe pattern onto a plane
Photograph of the pattern distortion reflected by mirror
Calculation of the slope error of the mirror surface with - High resolution of surface normal vectors (1000 x 1000 pixel) - High measurement precision (< 0.5 mrad)
Field-Version Deflectometry: Reflection of the absorber tube is used instead of projected patterns and permits a robust and simple application of the method for measurements in existing trough fields (with lower accuracy).
Heliostat Field Deflectometry: An automated system allows for the measurement of many or all heliostats within an existing field during one night (depending on circumstances of the field).
Deliverables:
- Space-resolved shape deviation of mirror, may lead to identification of optimization potential
- Evaluation of quality parameter (focal deviation of concentrated light)
- Evaluation of performance consequences for respective solar technology (intercept factor)
The Photogrammetry Measurement System
The Photogrammetry Measurement System is a flexible, portable and non-tactile tool for the accurate geometry evaluation of large structures and surfaces.
Method:
Application of retro-reflective targets on measurement points
Calibration with high precision length standards
Photographs of the object from many perspectives
Analysis of photo set with professional software
Torsion Measurement:
Additional methods characterize the torsion stiffness and similar parameters of a structure.
Deliverables:
- Analysis of 3D coordinates of reference points for quality control with very high precision of measurement: 1/50.000-1/100.000
- Assessment of geometry concerning CSP specific requirements
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