By analyzing the reflex intensities or even the intensity distribution in the whole diffractogram (Rietveld refinement) quantitative phase analysis of mixtures or structure refinement are possible.
The relative spatial arrangement of the crystallites of a sample is analyzed by means of texture analysis. For this, the orientation dependent distribution of diffracted intensity is measured. The resulting texture diagrams contain valuable information for the understanding of deformation or failure mechanisms of metals or ceramics and information about the growth and reaction characteristics as well as the properties of layered systems.
The radiographic inspection of a component as an additional technique is a fast and non-destructive test method for the detection of faults or the examination of production steps.
- X-ray powder diffractometer Siemens D5000 (Bragg-Brentano-focusing)
- X-ray texture diffractometer Siemens D5000TX
- Radiographic X-ray inspection chamber Hellwett Packard Faxitron