The scanning electron microscope (SEM) is used for the imaging of the samples surface. The inner microstructure can be observed by examining fracture samples or metallographic sections. The SEM delivers higher lateral resolution than an optical microscope.
Today, the SEM is one of the basic techniques for sample characterization in materials science. By the detectors installed, qualitative as well as quantitative information on topology, phase composition, proportion and orientation is retrieved.
The fractography analysis and in situ mechanical testing is also possible. EDS is used for qualitative and quantitative chemical analysis; crystallographic orientation analysis and microtexture investigations are conducted by electron backscattered diffraction (EBSD).
• Zeiss Ultra 55, field emission SEM , resolution 1 nm at 15 kV acceleration voltage.
• Secondary (SE) and back scatter electron detectors (BSE), both as chamber and in lens types
• Oxford INCA EDX- System with beam control for line scan and mapping.
• Oxford Channel5 / Nordlys II EBSD-system.
• In-situ testing stage for mechanical tensile and compression test.