The Zeiss Ultra 55 scanning electron microscope equipped with a field emission gun is our "working horse" in solving structural and analytical questions on a microscopic scale.
Four different electron detectors are available for image recording:
The scanning electron microscope is equipped with an EDX system which allows quantification of elements with z>4 (Be). Microscope control by means of the EDX software enables semi-automatic long-term analyses (e.g. serial analyses or high resolution mappings). Additionally, an EBSD system for identifying the phases present due to crystallographic properties is installed.