Institute of Materials Research - Analytical Methods

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X-ray fluorescence

By use of energy dispersive X-ray fluorescence (Oxford Instruments MESA 5000) the chemical composition of solids or powders (starting with element Na) can be analysed easily and quickly. If standards of known compositions are used, quantitative accuracy in the order of 0,1wt% can be achieved.

Analytical transmission electron microscopy (TEM)

The analytical transmission electron microscope is used to study microstructural features of submicron and nanometre scale. Transmission electron microscopy combines three modes of high-resolution materials characterization, i.e. imaging, spectroscopy (X-ray spectroscopy, electron loss spectroscopy), and diffraction (selected area diffraction, convergent beam diffraction). Thus, our 300 kV field emission microscope is a powerful tool for materials and solid-state science.

Thermal analyses (Thermo balance, Dilatometer)

Thermo balances (Setaram TG-DTA 92 und Setaram Setsys 16/18) are used to analyse weight changes in defined atmospheres (air, oxygen, argon, synthetic gases) at a high resolution (up to 1µg) at temperatures up to 1600°C. Simultaneously DTA measurements (differential thermal analyses) are possible. Dilatometer measurements can be run under vacuum or defined atmosphere to determine the coefficient of thermal expansion.

Scanning electron microscopy (SEM)

Fully digital LEO DSM 982 SEM equipped with a field emission gun is our "working horse" in solving microstructural and analytical problems. The microscope is equipped with a conventional secondary electron detector, an in-lens secondary electron detector, and a backscatterd detector. The Oxford EDS system allows quantification of elements with z>4 (Be).

Thermal analyses

For measuring specific heat and for determination of enthalpy of transformations the DSC method (differential scanning calorimetry) is used. The equipment (DSC 400, Fa. Netzsch Gerätebau) allows measurements up to 1400°C. Thermo balances (Setaram TG-DTA 92 und Setaram Setsys 16/18) are used to analyse weight changes in defined atmospheres (air, oxygen, argon, synthetic gases) at a high resolution (up to 1µg) at temperatures up to 1600°C. Simultaneously DTA measurements (differential thermal analyses) are possible. Dilatometer measurements can be run under vacuum or defined atmosphere to determine the coefficient of thermal expansion.

Optical microscopy

Various optical microscopes (e. g. Leitz MM6, Leitz Aristomet) equipped with electronic image acquisition and processing are available together with a micro hardness tester.

X-Ray analysis

The X-ray facilities comprise a Siemens D 5000 powder diffractometer with Bruker Diffrac plus software package, a Siemens D 5000 high resolution single crystal diffractometer for texture analysis and a Hewlett Packard Faxitron x-ray imaging system.