An­a­lyt­i­cal trans­mis­sion elec­tron mi­cro­scope

The Philips Tecnai F30 analytical transmission electron microscope at the DLR Institute of Materials Research
The Philips Tec­nai F30 an­a­lyt­i­cal trans­mis­sion elec­tron mi­cro­scope at the DLR In­sti­tute of Ma­te­ri­als Re­search
Image 1/2, Credit: DLR (CC-BY 3.0)

The Philips Tecnai F30 analytical transmission electron microscope at the DLR Institute of Materials Research

This large-scale fa­cil­i­ty at the DLR In­sti­tute of Ma­te­ri­als Re­search in Cologne en­ables mi­crostruc­tures to be mapped and anal­ysed down to an atom­ic lev­el.
Samples to be examined in the analytical transmission electron microscope – two aluminium preparations thinned via electrolysis and a powder sample on perforated carbon film stretched over a copper mesh; each sample is three millimetres in diameter
Sam­ples to be ex­am­ined in the an­a­lyt­i­cal trans­mis­sion elec­tron mi­cro­scope – two alu­mini­um prepa­ra­tions thinned via elec­trol­y­sis and a pow­der sam­ple on per­fo­rat­ed car­bon film stretched over a cop­per mesh; each sam­ple is three mil­lime­tres in di­am­e­ter
Image 2/2, Credit: DLR (CC-BY 3.0)

Samples to be examined in the analytical transmission electron microscope – two aluminium preparations thinned via electrolysis and a powder sample on perforated carbon film stretched over a copper mesh; each sample is three millimetres in diameter

Re­searchers use the an­a­lyt­i­cal trans­mis­sion elec­tron mi­cro­scope at the DLR In­sti­tute of Ma­te­ri­als Re­search in Cologne to study mi­crostruc­tures that are rel­e­vant to the pro­duc­tion of high-per­for­mance ma­te­ri­als.

This large-scale facility at the German Aerospace Center (DLR) Institute of Materials Research in Cologne enables microstructures to be mapped and analysed down to the atomic level. The results obtained assist with investigations into the processes and mechanisms that are relevant to the production and properties of high-performance materials, as well as the damage suffered by them.

Superb resolution

Among the wide range of microscopy techniques that exist, DLR’s analytical transmission electron microscopy (TEM) system – which irradiates samples with strongly accelerated electrons – is notable for its superb spatial resolution and versatility.

Analytical TEM is the only process that enables complete microstructural characterisation down to the nanometre scale. Modern materials with increasingly fine structures can thus be comprehensively described in terms of their topology, crystal structure and composition.

For instance, TEM makes it possible to investigate the lattice structure of individual nanoparticles as well as to map and analyse structural defects in metals and ceramics. The technique can also characterise the structure and composition of extremely fine alloy precipitates and identify the chemical composition of grain boundaries. These data are vital to understanding, describing and modelling the behaviour of modern materials.

Information obtained in this way can help detail the relationships between the internal structure and external properties of materials, which in turn provides the basis for developing optimised materials characterised by adapted micro and nanostructures. TEM has also proven successful for examining the causes of failures and material defects.

Contact
  • Volker Speelmann
    Head of Cen­tral Ex­pen­di­ture Man­age­ment
    Ger­man Aerospace Cen­ter (DLR)
    Telephone: +49 2203 601-4103
    Fax: +49 2203 601 4115
    Linder Höhe
    51147 Cologne
    Contact
  • Klemens Kelm
    Ger­man Aerospace Cen­ter (DLR)
    In­sti­tute of Ma­te­ri­als Re­search
    Telephone: +49 2203 601 4608
    Fax: +49 2203 696 480
    Linder Höhe
    51147 Cologne
    Contact
  • Jochen Krampe
    Ger­man Aerospace Cen­ter (DLR)
    Tech­nol­o­gy Mar­ket­ing
    Tech­nol­o­gy Mar­ket­ing
    Telephone: +49 2203 601-3665
    Linder Hoehe
    51170 Cologne
    Contact

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