HAADF-STEM-image of a lamellar-globular border in a g-TiAlalloy
The analytical transmission electron microscope is used to study microstructural features on a submicron to nanometer scale. Typical examples are concentration profiles of high spatial resolution, detection of grain boundary phases and segregations, evidence of orientation relationships between adjacent phases, and analyses of dislocations.
The analytical transmission electron microscope combines three modes of high-resolution materials characterization, i.e. imaging, spectroscopy (X-ray spectroscopy, electron energy loss spectroscopy), and diffraction (selected area diffraction, convergent beam diffraction). Thus, transmission electron microscopy is a powerful tool for materials and solid state science.
In our transmission electron microscope, four units are integrated into one common interface: The conventional transmission electron microscope, a scanning unit for STEM, an energy dispersive X-ray spectrometer (EDS) and an imaging electron energy loss filter for spectroscopy (EELS) and spectroscopic imaging (EFTEM). The transmission electron microscope is used for all topics within the institute of materials research.