The X-Ray laboratory of the Institute of Materials Research conduce nondestructive X-ray macrostructure and microstructure (XRD) analysis of materials.
Through diffraction of X-radiation on an atomic structure of arrayed crystallographic planes in dense or powder samples, characteristic diffractogram occur because of the optical path differences.
Requirement for the XRD analysis is a crystalline character of the material. The position of the observed interferences (diffraction peaks) depend on the crystal metrics (lattice parameter and crystal symmetry) while the observed intensity depends on the distribution of elements within the positions inside the crystalline structure. The collected data can be evaluated, with or without database assistance.
The Institute of Materials Research allotted three different diffractometer systems. All are equipped with copper-X-ray-tubes.
Different databases (ICCD, COD, ICSD) are available to support the evaluation of the diffractograms.
The facility is completed by a radiographic chamber for nondestructive X-ray macrostructure analysis (Hewlett Packard Faxitron). The radiograph illustratable thickness depends on the density of the material. The resulting radiographic films exhibits an optical resolution of ~ 100µm. Several photographic films are available for different applications.