Measurement of Ryugu sample A0383 using a JEOL field-emission scanning electron microscope (FE-SEM)
Image: 3/3, Credit:
DLR/MfN
The Sample Analysis Laboratory (SAL) provides a comprehensive range of instrumentation for structural, geochemical, mineralogical and elemental analysis at one location in a clean room environment allowing efficient analysis with a minimal disturbance to sensitive material. The research focus is on extraterrestrial material in the form of meteorites and returned samples, as well as analogue material for planetary research.
The main analytical instruments are: a field-emission scanning electron microscope (FE-SEM), a field-emission electron microprobe analyser (FE-EMPA), an X-ray diffractometer (XRD), and a FTIR microscope. A Raman microscope available in the Raman Laboratory complements SAL’s analytical capabilities. All the analytical instruments have sealed transfer vessels allowing samples to be introduced under protective atmospheres. We currently work with Hayabusa2, OSIRIS-REx, and Luna24 samples.
